Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing #30) (Hardcover)

Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing #30) By Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha Cover Image

Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing #30) (Hardcover)

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Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Product Details ISBN: 9780387257426
ISBN-10: 038725742X
Publisher: Springer
Publication Date: November 7th, 2005
Pages: 182
Language: English
Series: Frontiers in Electronic Testing