Ellipsometry: Principles and Techniques for Materials Characterization (Hardcover)

Ellipsometry: Principles and Techniques for Materials Characterization By Faustino Wahaia (Editor) Cover Image

Ellipsometry: Principles and Techniques for Materials Characterization (Hardcover)

By Faustino Wahaia (Editor)

$186.00


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Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
Product Details ISBN: 9789535136231
ISBN-10: 9535136232
Publisher: Intechopen
Publication Date: November 29th, 2017
Pages: 162
Language: English